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Version: v3.9.0

Wafer-defect model

Goal​

Deploy kind: Model named wafer-defect so the catalog knows the ONNX artifact. The vision inspection Application places it on edge-c. This page only creates the catalog row.

The published model repo is datasance/pot-edge-patterns/models/wafer-defect, tag 1.2.0. The manifest pins a digest for that tag.

The file is deploy/steps/13a-model-wafer-defect.yaml in pot-edge-patterns.

YAML​

Replace spec.registryId with the GHCR OCI row id from OCI registry.

wafer-defect
apiVersion: datasance.com/v3
kind: Model
metadata:
  name: wafer-defect
spec:
  repo: datasance/pot-edge-patterns/models/wafer-defect
  revision: sha256:735e4688b0b797224dab8da8758ac767b5cb131035e4a5c895c8d68b91f96298
  registryId: 9
  format: onnx

metadata.name stays wafer-defect. Vision inspection names that catalog row in spec.models.

Deploy with potctl. This file uses the Controller apiVersion. It is not an Edgelet-local model file.

Deploy​

potctl deploy -f deploy/steps/13a-model-wafer-defect.yaml

Use your edited copy if you changed registryId.

What you should see​

potctl describe model wafer-defect

The row is in Config → AI Model Catalog. It is not on edge-c yet. Vision inspection attaches and pulls it.

Common mistakes​

A local model on the node already uses the name wafer-defect. Remove that local model before this catalog row is used on the same node.

registryId still points at registry 1, or at the sample id 9, instead of your OCI row.

Next​

Vision user rules

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